Search results for "moments of OS"

showing 3 items of 3 documents

Ultimate Order Statistics-Based Prototype Reduction Schemes

2013

Published version of a chapter in the book: AI 2013: Advances in Artificial Intelligence. Also available from the publisher at: http://dx.doi.org/10.1007/978-3-319-03680-9_42 The objective of Prototype Reduction Schemes (PRSs) and Border Identification (BI) algorithms is to reduce the number of training vectors, while simultaneously attempting to guarantee that the classifier built on the reduced design set performs as well, or nearly as well, as the classifier built on the original design set. In this paper, we shall push the limit on the field of PRSs to see if we can obtain a classification accuracy comparable to the optimal, by condensing the information in the data set into a single tr…

Training setComputer scienceVDP::Mathematics and natural science: 400::Information and communication science: 420::Algorithms and computability theory: 422Order statisticcomputer.software_genreSupport vector machineData setBayes' theoremclassification using Order Statistics (OS)CMOSPrototype Reduction SchemesData miningmoments of OSClassifier (UML)computerParametric statistics
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On achieving near-optimal “Anti-Bayesian” Order Statistics-Based classification fora asymmetric exponential distributions

2013

Published version of a Chapter in the book: Computer Analysis of Images and Patterns. Also available from the publisher at: http://dx.doi.org/10.1007/978-3-642-40261-6_44 This paper considers the use of Order Statistics (OS) in the theory of Pattern Recognition (PR). The pioneering work on using OS for classification was presented in [1] for the Uniform distribution, where it was shown that optimal PR can be achieved in a counter-intuitive manner, diametrically opposed to the Bayesian paradigm, i.e., by comparing the testing sample to a few samples distant from the mean - which is distinct from the optimal Bayesian paradigm. In [2], we showed that the results could be extended for a few sym…

Uniform distribution (continuous)Cumulative distribution functionBayesian probabilityOrder statistic02 engineering and technology01 natural sciencesVDP::Mathematics and natural science: 400::Mathematics: 410::Analysis: 411Combinatorics010104 statistics & probabilityBayes' theoremExponential familyclassification using Order Statistics (OS)VDP::Mathematics and natural science: 400::Information and communication science: 420::Knowledge based systems: 4250202 electrical engineering electronic engineering information engineeringApplied mathematics020201 artificial intelligence & image processing0101 mathematicsNatural exponential familymoments of OSBeta distributionMathematics
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Optimal “anti-Bayesian” parametric pattern classification using Order Statistics criteria

2012

Published version of a chapter in the book: Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications. Also available from the publisher at: http://dx.doi.org/10.1007/978-3-642-33275-3_1 The gold standard for a classifier is the condition of optimality attained by the Bayesian classifier. Within a Bayesian paradigm, if we are allowed to compare the testing sample with only a single point in the feature space from each class, the optimal Bayesian strategy would be to achieve this based on the (Mahalanobis) distance from the corresponding means. The reader should observe that, in this context, the mean, in one sense, is the most central point in the respective distrib…

classification using Order Statistics (OS)VDP::Mathematics and natural science: 400::Information and communication science: 420VDP::Technology: 500::Information and communication technology: 550moments of OS
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